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Process Optimization to Eliminate Automatic Alignment Failures on the Scalable Device

  • A. Sumagpang Jr.
  • F. R. Gomez
  • R. Rodriguez

Journal of Engineering Research and Reports, Page 1-7
DOI: 10.9734/jerr/2020/v18i117197
Published: 30 October 2020

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Abstract


The paper focused in addressing the auto align defect at in-strip testing of a semiconductor scalable device in a leadframe technology. Pareto diagram and potential risk analysis were completed to identify the top reject contributors and eventually come-up with the robust solution. Reverse flow was employed to eliminate the alignment issues. The reverse flow, which is testing prior singulation process, eventually resolved the auto align and other singulation related defects as testing is done on a strip form. Ultimately, the error-proofing or Poka-Yoke approach by reverse flow lead to the elimination of auto align failures at final test. For future   works, the parameters and learnings could be used on devices with similar assembly defect occurrence.


Keywords:
  • Auto align
  • leadframe
  • semiconductor
  • test process
  • singulation.
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How to Cite

Jr., A. S., Gomez, F. R., & Rodriguez, R. (2020). Process Optimization to Eliminate Automatic Alignment Failures on the Scalable Device. Journal of Engineering Research and Reports, 18(1), 1-7. https://doi.org/10.9734/jerr/2020/v18i117197
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References

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Sumagpang Jr. A, Rada A. A systematic approach in optimizing critical processes of high density and high complexity new scalable device in MAT29 risk production using state-of-the-art platforms. Presented at the 22nd ASEMEP Technical Symposium, Philippines; 2012.

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Gomez FR, Mangaoang Jr. T. Elimination of ESD events and optimizing waterjet deflash process for reduction of leakage current failures on QFN-MR leadframe devices. Journal of Electrical Engineering, David Publishing Co. 2018;6(4):238- 243.

Sumagpang Jr. A, Gomez FR, Rodriguez R. Tool setup improvement for package scratch mitigation at end-of-line process. Journal of Engineering Research and Reports. 2020;12(3):1-5.
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